From Universal Enterprise

Resource Resource Overview Semiconductor Glossary Bare Die And Wafer Semiconductor Packages Glossary of Technical Terms

Glossary of Technical Terms: L A B C D E F G H I J K L M N O P Q R S T U V W X Y Z La lanthanum LAMMA laser micro-mass analysis LAMMS laser micro-mass spectroscopy LCA lifecycle analysis LCC leaded chip carrier LCL lower confidence limit LDD lightly doped drain LDL lower detection limit LDP low-density plasma LDPE low-density polyethylene LEC liquid encapsulated Czochralski crystal LEL lower explosive limit LER line edge roughness LF laminar flow LFL lower flammable limit LGQ linear Gaussian quadratic Li lithium LI laser interferometry LIC linear integrated circuit LID leadless inverted device LIFO last in LIMA laser-induced mass analysis LIMS laser-induced mass spectrometry LLCC leadless chip carrier LLD lower limit of detection LLNQ least lots next queue LM light microscope LMMA laser microprobe mass analysis LOCOS local oxidation of silicon LOS loss of selectivity LPC linear predictive coding; laser particle counter; low particle concentration; liquid-borne particle counter LPCVD low-pressure chemical vapor deposition LPD light point defect LPE liquid phase epitaxy LPI low-pressure isolation LPP laser-produced plasma LRS laser Raman spectroscopy LSE latex sphere equivalent LSHI large-scale hybrid integration LSI large-scale integration LSM laser scanning microscope LTA laser thermal anneal LTCVD low-temperature chemical vapor deposition LTO low-temperature oxidation/oxide LTPD lot tolerance percent defective LTV local thickness variation LV latent variable LVDT linear voltage differential transducer LVI low-voltage inverter LVS layout verification of schematic LWR linewidth reduction LWS large wafer study Pb lead