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Semiconductor Equipments

Die Handlers

Bonder Testers

System 226 Dedicated Wire Pull Tester:


System 226 Dedicated Wire Pull Tester


Affordable Wire Pull

  • Dedicated wire pull; system, for up to 100g
  • High-end standard of accuracy and repeatability at an entry-level price
  • Flexible and inexpensive way to perform precision destructive and non-destructive testing(NDT) of wire bond loops.
  • Small footprint makes economic ues of cleanroom space
  • Meets requirements of MIL Standard 883 and is CE Certified.
  • Download data to in-house SPC using RS232


The 226 is an easy to use system dedicated to wire bond pull testing. Designed for maxi-mum throughput at minimal cost, the 226 uses advanced transducer technology to give accurate, repeatable results.


Design


The controls of the 226 are simple and er-gonomic. Using the extremely flexible Leica S6 microscope, the 226 easily adjusts to accommodate a broad spectrum of users. The familiar controls make training quick and easy, minimizing downtime. The stan-dard computer mouse controls the hook height and rotation, along with triggering the test. A numeric keypad allows the op-erator to enter failure codes, and the test results are visible on the LCD panel built into the mainframe.


Operation


Able to perform both destructive and non-destructive tests, the 226 collects force data against the wire every 10 microseconds. When performing destructive bond testing the maximum load is monitored and the test stops automatically when the load force falls from its maximum. Non-destruc-tive testing is controlled so that the rate of load application exactly meets the user's programmed limit. Load variance also is programmable by the user prior to testing to provide stricter controls.


After each test, the hook automatically returns to the start position.


Calibration


Calibration is a function of the software, and no extra fixtures are required. An easily accessed menu allows the system's cali-bration to be verified. Should recalibration be necessary, instructions are displayed, prompting the operator through the proce-dure. NIST traceable calibration weights are available for use with the System 226.


Data Analysis


An LCD panel embedded in the front panel of the mainframe is used for viewing the system status and test results. Test data and statistical reports can also be printed to an external printer, or output to a PC using the available RS-232 connection. Reports including mean and standard deviation, Cpk, Cpl, Cpu, and other statistical data are available. More comprehensive SPC software is also available as an option.



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